Improved Uniform Test Error Bounds

Bax, Eric (1997) Improved Uniform Test Error Bounds. Technical Report. California Institute of Technology. [CaltechCSTR:1997.cs-tr-97-15]

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Abstract

We derive distribution-free uniform test error bounds that improve on VC-type bounds for validation. We show how to use knowledge of test inputs to improve the bounds. The bounds are sharp, but they require intense computation. We introduce a method to trade sharpness for speed of computation. Also, we compute the bounds for several test cases.

EPrint Type:	Monograph (Technical Report)
Subjects:	All Records
ID Code:	166
Deposited By:	Caltech Library System
Deposited On:	25 April 2001
Record Number:	CaltechCSTR:1997.cs-tr-97-15
Official Persistent URL:	http://resolver.caltech.edu/CaltechCSTR:1997.cs-tr-97-15
Usage Policy:	You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format.

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