Techniques for Testing Integrated Circuits

DeBenedictis, Erik P. (1983) Techniques for Testing Integrated Circuits. Technical Report. California Institute of Technology. [CaltechCSTR:1982.4777-tr-82]

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EPrint Type:	Monograph (Technical Report)
Subjects:	All Records
ID Code:	480
Deposited By:	Caltech Library System
Deposited On:	02 January 2003
Record Number:	CaltechCSTR:1982.4777-tr-82
Official Persistent URL:	http://resolver.caltech.edu/CaltechCSTR:1982.4777-tr-82
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