Testing Delay-Insensitive Circuits

Martin, Alain J. and Hazewindus, Pieter J. (1990) Testing Delay-Insensitive Circuits. Technical Report. California Institute of Technology. [CaltechCSTR:1990.cs-tr-90-17]

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Abstract

We show that a single stuck-at fault in a non-redundant delay-insensitive circuit results in a transition either not taking place or firing prematurely, or both, during an execution of the circuit. A transition not taking place can be tested easily, as this always prevents a transition on a primary output from taking place. A premature firing can also be tested but the addition of testing points may be required to enforce the premature firing and to propagate the transition to a primary output. Hence all single stuck-at faults are testable. All test sequences can be generated from the high-level specification of the circuit. The circuits are hazard-free in normal operation and during the tests.

EPrint Type:	Monograph (Technical Report)
Subjects:	All Records
ID Code:	77
Deposited By:	Caltech Library System
Deposited On:	25 April 2001
Record Number:	CaltechCSTR:1990.cs-tr-90-17
Official Persistent URL:	http://resolver.caltech.edu/CaltechCSTR:1990.cs-tr-90-17
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